THE CRITICAL POINT METHOD FOR DRYING ELECTRON MICROSCOPE SPECIMENS

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作者：
ANDERSON, TF
OSTER, CF
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JOURNAL OF APPLIED PHYSICS | 1953年 / 24卷 / 11期
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O59 [应用物理学];
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页码：1416 / 1416
页数：1
相关论文
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[1]   TECHNIQUES FOR THE PRESERVATION OF 3-DIMENSIONAL STRUCTURE IN PREPARING SPECIMENS FOR THE ELECTRON MICROSCOPE [J].
ANDERSON, TF .
TRANSACTIONS OF THE NEW YORK ACADEMY OF SCIENCES, 1951, 13 (04) :130-134
[2]   STEREOSCOPIC STUDIES OF CELLS AND VIRUSES IN THE ELECTRON MICROSCOPE [J].
ANDERSON, TF .
AMERICAN NATURALIST, 1952, 86 (827) :91-100
[3]   THE USE OF CRITICAL POINT PHENOMENA IN PREPARING SPECIMENS FOR THE ELECTRON MICROSCOPE [J].
ANDERSON, TF .
JOURNAL OF APPLIED PHYSICS, 1950, 21 (07) :724-724
[4]  
ANDERSON TF, 1952, J APPL PHYS, V23, P158
[5]  
ANDERSON TF, 1953, J APPL PHYS, V24, P117
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