ELLIPSOMETRIC METHOD FOR MEASUREMENT OF OPTICAL-CONSTANTS AND THICKNESS OF THIN ABSORBING FILMS ON METAL SUBSTRATES

被引：0
作者：
SHKLYAREVSKII, IN
ELSHAZLI, AF
YAROVAYA, RG
KOSTYUK, VP
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来源：
OPTIKA I SPEKTROSKOPIYA | 1974年 / 36卷 / 01期
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中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
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页码：199 / 204
页数：6
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