ULTRAHIGH VACUUM REFLECTOMETER FOR USE WITH EXTREME ULTRAVIOLET SYNCHROTRON RADIATION

被引：13
作者：
FEUERBACHER, B
SKIBOWSKI, M
GODWIN, RP
机构：
[1] Sektion Physik, Universität München
[2] Deutsches Elektronen-Synchrotron, Hamburg
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 1969年 / 40卷 / 02期
关键词：
D O I：
10.1063/1.1683923
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
An ultrahigh vacuum reflectometer is described. It can be used to study reflectance, transmittance, and photoemission on samples evaporated in situ. The angle of incidence can be varied from 0 to ±90° in steps of 7.5°. The system rotates about the axis of the incident light for study of polarization effects. With the polarized continuum of synchrotron radiation and a normal-incidence monochromator the reflectometer allows measurements with polarized light at wavelengths down to about 300 Å. © 1969 The American Institute of Physics.
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页码：305 / +
页数：1
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