SI L2,3 EDGE IN REFLECTANCE OF CVD SIC

被引:0
|
作者
REHN, V
JONES, VO
CHOYKE, WJ
机构
[1] WESTINGHOUSE ELECT CORP,PITTSBURGH,PA 15235
[2] USN,WEAPONS CTR,CHINA LAKE,CA 93555
来源
BULLETIN OF THE AMERICAN PHYSICAL SOCIETY | 1978年 / 23卷 / 03期
关键词
D O I
暂无
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
引用
收藏
页码:205 / 205
页数:1
相关论文
共 50 条
  • [31] Analysis of X-ray adsorption edges: L2,3 edge of FeCl4-
    Bagus, Paul S.
    Nelin, Connie J.
    Ilton, Eugene S.
    Sassi, Michel J.
    Rosso, Kevin M.
    JOURNAL OF CHEMICAL PHYSICS, 2017, 147 (22):
  • [32] MEASUREMENT OF PHOTOABSORPTION OF LITHIUM HALIDES NEAR LITHIUM K EDGE AND OF SODIUM HALIDES NEAR SODIUM L2,3 EDGE
    HAENSEL, R
    KUNZ, C
    SASAKI, T
    SONNTAG, B
    BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1968, 13 (08): : 984 - &
  • [33] Investigation of bonding in nano-SiO2 by Si L2,3 X-ray absorption near-edge structure spectroscopy
    Wu, Z.Y.
    Ibrahim, K.
    Li, G.
    Zhang, J.
    Liu, F.Q.
    Abbas, M.I.
    Hu, R.
    Qian, H.J.
    Tang, F.Q.
    Acta Metallurgica Sinica (English Letters), 2001, 14 (06) : 473 - 478
  • [34] Attosecond Transient Absorption Spectroscopy near the L2,3-edge of Argon
    Chew, Andrew
    Douguet, Nicolas
    Cariker, Coleman
    Li, Jie
    Ren, Xiaoming
    Yin, Yanchun
    Argenti, Luca
    Chang, Zenghu
    Hill, Wendell T., III
    2018 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO), 2018,
  • [35] Theoretical study of angular-dependent L2,3-edge XMCD
    Maruyama, Takashi
    Hojo, Ikuko
    Nagamatsu, Shin-ichi
    Fujikawa, Takashi
    JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 2010, 180 (1-3) : 46 - 52
  • [36] THERMOREFLECTANCE AND TEMPERATURE-DEPENDENCE OF L2,3 SOFT-X-RAY THRESHOLD IN SI
    ASPNES, DE
    BAUER, RS
    BACHRACH, RZ
    MCMENAMIN, JC
    PHYSICAL REVIEW B, 1977, 16 (12): : 5436 - 5442
  • [37] Nonlinear XUV-optical transient grating spectroscopy at the Si L2,3-edge (vol 114, 181101, 2019)
    Bohinc, R.
    Pamfilidis, G.
    Rehault, J.
    Radi, P.
    Milne, C.
    Szlachetko, J.
    Bencivenga, F.
    Capotondi, F.
    Cucini, R.
    Foglia, L.
    Masciovecchio, C.
    Mincigrucci, R.
    Pedersoli, E.
    Simoncig, A.
    Mahne, N.
    Cannizzo, A.
    Frey, H. M.
    Ollmann, Z.
    Feurer, T.
    Maznev, A. A.
    Nelson, K.
    Knopp, G.
    APPLIED PHYSICS LETTERS, 2021, 119 (02)
  • [38] Efficiency of Si L2,3 x-ray generation in the SiO2/Si system by electron impact
    A. S. Shulakov
    A. P. Braiko
    N. V. Moroz
    V. A. Fomichev
    Physics of the Solid State, 1998, 40 : 1754 - 1757
  • [39] Efficiency of Si L2,3 X-ray generation in the SiO2/Si system by electron impact
    Shulakov, AS
    Braiko, AP
    Moroz, NV
    Fomichev, VA
    PHYSICS OF THE SOLID STATE, 1998, 40 (10) : 1754 - 1757
  • [40] L2,3M2,3M2,3 AND L2,3M2,3N1 AUGER-SPECTRA OF FREE POTASSIUM ATOMS
    AKSELA, S
    KELLOKUMPU, M
    AKSELA, H
    VAYRYNEN, J
    PHYSICAL REVIEW A, 1981, 23 (05) : 2374 - 2380