SINGLE-ELECTRON CAPTURE AND LOSS CROSS-SECTIONS VERSUS TARGET-Z FOR 1 MEV/U OXYGEN IONS INCIDENT ON GASES

[1] SINGLE ELECTRON-CAPTURE AND LOSS CROSS-SECTIONS FOR HIGHLY STRIPPED FE IONS IN HYDROGEN AT 3.4 MEV-NUCLEON [J]. PHYSICS LETTERS A, 1977, 62 (06) : 407 - 408

[2] Choi B.-H., 1973, Atomic Data, V5, P291, DOI 10.1016/S0092-640X(73)80010-5

[3] ELECTRON-CAPTURE AND LOSS FOR 2.5-200-MEV S-16(13+) + HE COLLISIONS [J]. PHYSICAL REVIEW A, 1986, 33 (01): : 762 - 764

[4] Crothers D. S. F., 1980, Journal of Physics B (Atomic and Molecular Physics), V13, P2277, DOI 10.1088/0022-3700/13/11/019

[5] IONIZATION OF ONE-ELECTRON IONS AND CAPTURE BY BARE AND ONE-ELECTRON IONS OF C,N,O, AND F ON HE [J]. PHYSICAL REVIEW A, 1981, 24 (03): : 1237 - 1248

[6] DMITRIEV IS, 1966, SOV PHYS JETP-USSR, V22, P352

[7] PLASMA IMPURITIES AND COOLING [J]. PHYSICS REPORTS-REVIEW SECTION OF PHYSICS LETTERS, 1978, 37 (02): : 125 - 163

[8] CHARGE-STATE DEPENDENCE OF SINGLE-ELECTRON-CAPTURE AND SINGLE-ELECTRON-LOSS CROSS-SECTIONS FOR HIGHLY STRIPPED V-IONS IN HE AT 8.55MEVAMU-1 [J]. JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS, 1985, 18 (12) : 2503 - 2508

[9] DOUBLE-ELECTRON AND SINGLE-ELECTRON CAPTURE AND LOSS IN COLLISIONS OF 1-2-MEV/U BORON, OXYGEN, AND SILICON PROJECTILES WITH HELIUM-ATOMS [J]. PHYSICAL REVIEW A, 1987, 35 (02): : 585 - 590

[10] SINGLE-ELECTRON-CAPTURE CROSS-SECTION FOR MEDIUM-VELOCITY AND HIGH-VELOCITY, HIGHLY CHARGED IONS COLLIDING WITH ATOMS [J]. PHYSICAL REVIEW A, 1981, 23 (02): : 597 - 610

[1] SINGLE ELECTRON-CAPTURE AND LOSS CROSS-SECTIONS FOR HIGHLY STRIPPED FE IONS IN HYDROGEN AT 3.4 MEV-NUCLEON [J]. PHYSICS LETTERS A, 1977, 62 (06) : 407 - 408

[2] Choi B.-H., 1973, Atomic Data, V5, P291, DOI 10.1016/S0092-640X(73)80010-5

[3] ELECTRON-CAPTURE AND LOSS FOR 2.5-200-MEV S-16(13+) + HE COLLISIONS [J]. PHYSICAL REVIEW A, 1986, 33 (01): : 762 - 764

[4] Crothers D. S. F., 1980, Journal of Physics B (Atomic and Molecular Physics), V13, P2277, DOI 10.1088/0022-3700/13/11/019

[5] IONIZATION OF ONE-ELECTRON IONS AND CAPTURE BY BARE AND ONE-ELECTRON IONS OF C,N,O, AND F ON HE [J]. PHYSICAL REVIEW A, 1981, 24 (03): : 1237 - 1248

[6] DMITRIEV IS, 1966, SOV PHYS JETP-USSR, V22, P352

[7] PLASMA IMPURITIES AND COOLING [J]. PHYSICS REPORTS-REVIEW SECTION OF PHYSICS LETTERS, 1978, 37 (02): : 125 - 163

[8] CHARGE-STATE DEPENDENCE OF SINGLE-ELECTRON-CAPTURE AND SINGLE-ELECTRON-LOSS CROSS-SECTIONS FOR HIGHLY STRIPPED V-IONS IN HE AT 8.55MEVAMU-1 [J]. JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS, 1985, 18 (12) : 2503 - 2508

[9] DOUBLE-ELECTRON AND SINGLE-ELECTRON CAPTURE AND LOSS IN COLLISIONS OF 1-2-MEV/U BORON, OXYGEN, AND SILICON PROJECTILES WITH HELIUM-ATOMS [J]. PHYSICAL REVIEW A, 1987, 35 (02): : 585 - 590

[10] SINGLE-ELECTRON-CAPTURE CROSS-SECTION FOR MEDIUM-VELOCITY AND HIGH-VELOCITY, HIGHLY CHARGED IONS COLLIDING WITH ATOMS [J]. PHYSICAL REVIEW A, 1981, 23 (02): : 597 - 610