USE OF ANOMALOUS X-RAY TRANSMISSION FOR DETECTION OF DEFECTS PRODUCED IN SILICON AND GERMANIUM BY FAST NEUTRON IRRADIATION

被引：23
作者：
BALDWIN, TO
THOMAS, JE
机构：
来源：
JOURNAL OF APPLIED PHYSICS | 1968年 / 39卷 / 09期
关键词：
D O I：
10.1063/1.1656982
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
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页码：4391 / &
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