CUMULATIVE SIZE EFFECTS IN ELECTRICAL-CONDUCTIVITY OF THIN SEMI-METAL FILMS

被引：0
作者：
PICHARD, CR
TOSSER, AJ
DESCHACHT, D
BOYER, A
GROUBERT, E
TELLIER, CR
机构：
[1] UNIV MONTPELLIER 2,PHARM,CTR EDUD ELECTR SOLIDES,PHYS APPL LAB 21,F-34060 MONTPELLIER,FRANCE
[2] ECOLE NATL SUPER MICROMECAN & MICROTECH,CHRONOMET & PIEZOELECT LAB,F-25030 BESANCON,FRANCE
来源：
JOURNAL OF MATERIALS SCIENCE | 1981年 / 16卷 / 10期
关键词：
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：2798 / 2802
页数：5
相关论文
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[1]  
[Anonymous], [No title captured]
[2]   ELECTRICAL CONDUCTION IN THIN CONTINUOUS FILMS [J].
COUTTS, TJ .
THIN SOLID FILMS, 1971, 7 (02) :77-&
[3]   EFFECT OF GRAIN-BOUNDARY SCATTERING ON THE ELECTRICAL-CONDUCTIVITY OF ANTIMONY FILMS [J].
DESCHACHT, D ;
BOYER, A ;
GROUBERT, E .
THIN SOLID FILMS, 1980, 70 (02) :311-317
[4]  
FUCHS K, 1938, P CAMBRIDGE PHILOS S, V34, P10
[5]   SIZE EFFECTS AND PIEZORESISTANCE IN METAL-FILMS [J].
KLOKHOLM, E ;
MAYADAS, AF .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1972, 9 (01) :441-&
[6]   ELECTRICAL-RESISTIVITY MODEL FOR POLYCRYSTALLINE FILMS - CASE OF ARBITRARY REFLECTION AT EXTERNAL SURFACES [J].
MAYADAS, AF ;
SHATZKES, M .
PHYSICAL REVIEW B, 1970, 1 (04) :1382-&
[7]   EXACT AND APPROXIMATE EQUATIONS FOR THICKNESS DEPENDENCE OF RESISTIVITY AND ITS TEMPERATURE COEFFICIENT IN THIN POLYCRYSTALLINE METAL-FILMS [J].
MOLA, EE ;
HERAS, JM .
THIN SOLID FILMS, 1973, 18 (01) :137-144
[8]   3-DIMENSIONAL MODEL FOR GRAIN-BOUNDARY RESISTIVITY IN METAL-FILMS [J].
PICHARD, CR ;
TELLIER, CR ;
TOSSER, AJ .
THIN SOLID FILMS, 1979, 62 (02) :189-194
[9]   LINEAR VARIATIONS IN CONDUCTIVITY WITH THICKNESS OF THIN POLYCRYSTALLINE FILMS [J].
PICHARD, CR ;
TELLIER, CR ;
TOSSER, AJ .
JOURNAL OF MATERIALS SCIENCE, 1980, 15 (09) :2236-2240
[10]   THERMOELECTRIC-POWER OF THIN POLYCRYSTALLINE METAL-FILMS IN AN EFFECTIVE MEAN FREE-PATH MODEL [J].
PICHARD, CR ;
TELLIER, CR ;
TOSSER, AJ .
JOURNAL OF PHYSICS F-METAL PHYSICS, 1980, 10 (09) :2009-2014
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