共 17 条
- [1] MEASUREMENT OF NEGATIVE-IONS BY PHOTODETACHMENT WITH YAG LASER IN DISCHARGE PLASMAS [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1990, 29 (09): : L1712 - L1715
- [2] OPTOGALVANIC MEASUREMENT OF NEGATIVE-IONS IN PLASMA BY SEMICONDUCTOR-LASERS [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1990, 29 (10): : L1915 - L1918
- [4] AMEMIYA H, 1991, JPN J APPL PHYS 2, V30, pL1895
- [5] PRODUCTION OF ELECTRON-FREE PLASMA BY USING A MAGNETIC FILTER IN RADIO-FREQUENCY DISCHARGE [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1991, 30 (10): : 2601 - 2605
- [8] DETECTION TECHNIQUE OF NEGATIVE-IONS BY PHOTODETACHMENT IN SF6 LOW-FREQUENCY DISCHARGE [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1990, 29 (04): : 767 - 768
- [10] KRAMER J, 1986, J APPL PHYS, V60, P3082