NEUTRON HARDNESS ASSURANCE CONSIDERATIONS FOR TEMPERATURE COMPENSATED REFERENCE DIODES

被引：2
|
作者：
MILLWARD, DG [1 ]
机构：
[1] BOEING CO, SEATTLE, WA 98124 USA
来源：
IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1978年 / 25卷 / 06期
关键词：
D O I：
10.1109/TNS.1978.4329563
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：1517 / 1521
页数：5
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