DETERMINATION OF COMPENSATION RATIO IN SILICON BY AN ELECTRON SPIN RESONANCE METHOD

被引：3

作者：

IGO, T

机构：

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D O I：

10.1143/JJAP.4.523

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：523 / &

共 15 条

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