DETERMINATION OF COMPENSATION RATIO IN SILICON BY AN ELECTRON SPIN RESONANCE METHOD

被引：3
作者：
IGO, T
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来源：
JAPANESE JOURNAL OF APPLIED PHYSICS | 1965年 / 4卷 / 07期
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D O I：
10.1143/JJAP.4.523
中图分类号：
O59 [应用物理学];
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页码：523 / &
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