Results of an experimental study are presented in which the near-field probe was used as a diagnostic tool to locate defective elements in a planar array. The near-field data were processed not only to obtain the far-field patterns of the array under the test, but also to reconstruct the aperture field for diagnostic purposes. The backward transform enables the near-field probe to identify accurately aperture faults at a distance, free of interactions and couplings with the array elements. In practice, to recover the aperture field properly from the near-field distribution, the evanescent components in the computed far-field spectrum must be excluded from the inverse process with fast-Fourier-transform (FFT) techniques. For low-gain array antennas, a correction on the far-field spectrum is required to remove the contribution of the probe and the element factor before the inverse transform, strongly enhancing the resolution.
