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EFFECT OF OXIDE ADDITIVE IN SILICON-NITRIDE ON INTERFACIAL STRUCTURE AND STRENGTH OF SILICON-NITRIDE JOINTS BRAZED WITH ALUMINUM
被引:27
作者
:
NING, XS
论文数:
0
引用数:
0
h-index:
0
机构:
NATL DEF ACAD,YOKOSUKA,KANAGAWA 239,JAPAN
NATL DEF ACAD,YOKOSUKA,KANAGAWA 239,JAPAN
NING, XS
[
1
]
OKAMOTO, T
论文数:
0
引用数:
0
h-index:
0
机构:
NATL DEF ACAD,YOKOSUKA,KANAGAWA 239,JAPAN
NATL DEF ACAD,YOKOSUKA,KANAGAWA 239,JAPAN
OKAMOTO, T
[
1
]
MIYAMOTO, Y
论文数:
0
引用数:
0
h-index:
0
机构:
NATL DEF ACAD,YOKOSUKA,KANAGAWA 239,JAPAN
NATL DEF ACAD,YOKOSUKA,KANAGAWA 239,JAPAN
MIYAMOTO, Y
[
1
]
KOREEDA, A
论文数:
0
引用数:
0
h-index:
0
机构:
NATL DEF ACAD,YOKOSUKA,KANAGAWA 239,JAPAN
NATL DEF ACAD,YOKOSUKA,KANAGAWA 239,JAPAN
KOREEDA, A
[
1
]
SUGANUMA, K
论文数:
0
引用数:
0
h-index:
0
机构:
NATL DEF ACAD,YOKOSUKA,KANAGAWA 239,JAPAN
NATL DEF ACAD,YOKOSUKA,KANAGAWA 239,JAPAN
SUGANUMA, K
[
1
]
机构
:
[1]
NATL DEF ACAD,YOKOSUKA,KANAGAWA 239,JAPAN
来源
:
JOURNAL OF MATERIALS SCIENCE
|
1989年
/ 24卷
/ 08期
关键词
:
D O I
:
10.1007/BF02385639
中图分类号
:
T [工业技术];
学科分类号
:
08 ;
摘要
:
引用
收藏
页码:2865 / 2870
页数:6
相关论文
共 5 条
[1]
X-RAY PHOTOELECTRON SPECTRA OF ALUMINUM AND OXIDIZED ALUMINUM
[J].
BARRIE, A
论文数:
0
引用数:
0
h-index:
0
机构:
VACUUM GENERATORS LTD,E GRINSTEAD,SUSSEX,ENGLAND
VACUUM GENERATORS LTD,E GRINSTEAD,SUSSEX,ENGLAND
BARRIE, A
.
CHEMICAL PHYSICS LETTERS,
1973,
19
(01)
:109
-113
[2]
X-RAY PHOTOELECTRON STUDY OF SOME SILICON-OXYGEN COMPOUNDS
[J].
CARRIERE, B
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV LOUIS PASTEUR,MINERAL LAB,CNRS,EQUIPE RECH ASSOC 07,F-67070 STRASBOURG,FRANCE
CARRIERE, B
;
DEVILLE, JP
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV LOUIS PASTEUR,MINERAL LAB,CNRS,EQUIPE RECH ASSOC 07,F-67070 STRASBOURG,FRANCE
DEVILLE, JP
;
BRION, D
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV LOUIS PASTEUR,MINERAL LAB,CNRS,EQUIPE RECH ASSOC 07,F-67070 STRASBOURG,FRANCE
BRION, D
;
ESCARD, J
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV LOUIS PASTEUR,MINERAL LAB,CNRS,EQUIPE RECH ASSOC 07,F-67070 STRASBOURG,FRANCE
ESCARD, J
.
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA,
1977,
10
(02)
:85
-91
[3]
NING XS, 1987, PHIL MAG LETT, V55, P193
[4]
NING XS, 1989, J MATER SCI, V24
[5]
SURFACE OXIDATION OF SILICON-NITRIDE FILMS
[J].
RAIDER, SI
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,SYST PROD DIV,HOPEWELL JUNCTION,NY 12533
IBM CORP,SYST PROD DIV,HOPEWELL JUNCTION,NY 12533
RAIDER, SI
;
FLITSCH, R
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,SYST PROD DIV,HOPEWELL JUNCTION,NY 12533
IBM CORP,SYST PROD DIV,HOPEWELL JUNCTION,NY 12533
FLITSCH, R
;
ABOAF, JA
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,SYST PROD DIV,HOPEWELL JUNCTION,NY 12533
IBM CORP,SYST PROD DIV,HOPEWELL JUNCTION,NY 12533
ABOAF, JA
;
PLISKIN, WA
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,SYST PROD DIV,HOPEWELL JUNCTION,NY 12533
IBM CORP,SYST PROD DIV,HOPEWELL JUNCTION,NY 12533
PLISKIN, WA
.
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1976,
123
(04)
:560
-565
←
1
→
共 5 条
[1]
X-RAY PHOTOELECTRON SPECTRA OF ALUMINUM AND OXIDIZED ALUMINUM
[J].
BARRIE, A
论文数:
0
引用数:
0
h-index:
0
机构:
VACUUM GENERATORS LTD,E GRINSTEAD,SUSSEX,ENGLAND
VACUUM GENERATORS LTD,E GRINSTEAD,SUSSEX,ENGLAND
BARRIE, A
.
CHEMICAL PHYSICS LETTERS,
1973,
19
(01)
:109
-113
[2]
X-RAY PHOTOELECTRON STUDY OF SOME SILICON-OXYGEN COMPOUNDS
[J].
CARRIERE, B
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV LOUIS PASTEUR,MINERAL LAB,CNRS,EQUIPE RECH ASSOC 07,F-67070 STRASBOURG,FRANCE
CARRIERE, B
;
DEVILLE, JP
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV LOUIS PASTEUR,MINERAL LAB,CNRS,EQUIPE RECH ASSOC 07,F-67070 STRASBOURG,FRANCE
DEVILLE, JP
;
BRION, D
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV LOUIS PASTEUR,MINERAL LAB,CNRS,EQUIPE RECH ASSOC 07,F-67070 STRASBOURG,FRANCE
BRION, D
;
ESCARD, J
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV LOUIS PASTEUR,MINERAL LAB,CNRS,EQUIPE RECH ASSOC 07,F-67070 STRASBOURG,FRANCE
ESCARD, J
.
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA,
1977,
10
(02)
:85
-91
[3]
NING XS, 1987, PHIL MAG LETT, V55, P193
[4]
NING XS, 1989, J MATER SCI, V24
[5]
SURFACE OXIDATION OF SILICON-NITRIDE FILMS
[J].
RAIDER, SI
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,SYST PROD DIV,HOPEWELL JUNCTION,NY 12533
IBM CORP,SYST PROD DIV,HOPEWELL JUNCTION,NY 12533
RAIDER, SI
;
FLITSCH, R
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,SYST PROD DIV,HOPEWELL JUNCTION,NY 12533
IBM CORP,SYST PROD DIV,HOPEWELL JUNCTION,NY 12533
FLITSCH, R
;
ABOAF, JA
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,SYST PROD DIV,HOPEWELL JUNCTION,NY 12533
IBM CORP,SYST PROD DIV,HOPEWELL JUNCTION,NY 12533
ABOAF, JA
;
PLISKIN, WA
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,SYST PROD DIV,HOPEWELL JUNCTION,NY 12533
IBM CORP,SYST PROD DIV,HOPEWELL JUNCTION,NY 12533
PLISKIN, WA
.
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1976,
123
(04)
:560
-565
←
1
→