A diffraction adapter for the electron microscope

被引：10
|
作者：
Hillier, J [1 ]
Baker, RF [1 ]
Zworykin, VK [1 ]
机构：
[1] RCA Mfg Co, Res Labs, Camden, NJ USA
来源：
JOURNAL OF APPLIED PHYSICS | 1942年 / 13卷 / 09期
关键词：
D O I：
10.1063/1.1714911
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：571 / 577
页数：7
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