MICROWAVE SURFACE-RESISTANCE OF YBA2CU3O7 THIN-FILMS ON LAALO3 SUBSTRATES

被引：10

作者：

COOKE, DW ^{[1
]}

GRAY, ER ^{[1
]}

ARENDT, PN ^{[1
]}

ELLIOTT, NE ^{[1
]}

ROLLETT, AD ^{[1
]}

SCHOFIELD, TG ^{[1
]}

MOGROCAMPERO, A ^{[1
]}

TURNER, LG ^{[1
]}

机构：

[1] GE,CTR RES & DEV,SCHENECTADY,NY 12301

来源：

JOURNAL OF APPLIED PHYSICS | 1990年 / 68卷 / 05期

关键词：

D O I：

10.1063/1.346493

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The surface resistance Rs of YBa2Cu3O 7 (YBCO) thin films (0.6±0.1 μm) deposited onto 2.5-cm diam (100) LaAlO3 substrates has been measured at 22 GHz using both Cu and Nb cavities. The surface resistance falls precipitously at the superconducting transition (Tc =90 K) from a normal state value of approximately 2 Ω to a 77 K value of 13.7±1 mΩ, which is 1.6 times lower than Cu. At 4 K the surface resistance is 1±0.1 mΩ, as measured in a Nb superconducting cavity, which is an order of magnitude lower than Cu. The critical current density at 77 K is 4.5×104 A/cm2. Pole figure analyses show the ratio of c-axis to a-axis-oriented material in the film is 2.4:1. YBCO films deposited onto either LaGaO3 or LaAlO3 substrates with varying c/a ratios yield surface resistance values at 77 K that are crudely correlated with R s. Therefore, the principal effect of orienting the material is to improve the sharpness of the high-frequency superconducting transition, consistent with the notion that the sharpness is associated with intergranular rather than intragranular properties.

引用

页码：2514 / 2516

页数：3

共 8 条

[1]

COOKE DW, 1990, P SOC PHOTO-OPT INS, V1187, P338, DOI 10.1117/12.965176

[2] SURFACE-RESISTANCE OF YBA2CU3O7 FILMS ON SRTIO3 AND LAGAO3 SUBSTRATES [J].