RAD, A PROGRAM FOR ANALYSIS OF X-RAY-DIFFRACTION DATA FROM AMORPHOUS MATERIALS FOR PERSONAL COMPUTERS

被引：172
|
作者：
PETKOV, V
机构：
来源：
JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1989年 / 22卷
关键词：
D O I：
10.1107/S0021889889002104
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
引用
收藏
页码：387 / 389
页数：3
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