RAD, A PROGRAM FOR ANALYSIS OF X-RAY-DIFFRACTION DATA FROM AMORPHOUS MATERIALS FOR PERSONAL COMPUTERS

被引：172

作者：

PETKOV, V

机构：

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1989年 / 22卷

关键词：

D O I：

10.1107/S0021889889002104

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

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页码：387 / 389

页数：3

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