SETTING SENSITIVITY IN TALBOT INTERFEROMETRY WITH MODIFIED GRATINGS

被引：30
作者：
KOTHIYAL, MP [1 ]
SRIRAM, KV [1 ]
SIROHI, RS [1 ]
机构：
[1] PHYS TECH BUNDESANSTALT,OPT LAB,W-3300 BRAUNSCHWEIG,GERMANY
来源：
OPTICS AND LASER TECHNOLOGY | 1991年 / 23卷 / 06期
关键词：
INTERFEROMETRY; TALBOT INTERFEROMETRY; GRATINGS;
D O I：
10.1016/0030-3992(91)90076-Z
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
A dual field grating has been introduced for use in Talbot interferometry. We report here results of an experimental investigation on setting sensitivity when using these gratings for testing.
引用
收藏
页码：361 / 365
页数：5
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