ANALYSIS OF SOLID-SURFACES BY SECONDARY ION MASS-SPECTROMETRY

被引：0

作者：

VANCEA, I ^{[1
]}

机构：

[1] INST IZOTOPI STABILI,CLUJ,ROMANIA

来源：

STUDII SI CERCETARI DE FIZICA | 1976年 / 28卷 / 09期

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D O I：

暂无

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

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页码：921 / 939

页数：19

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[7] UNTERSUCHUNGEN ZUM SPEKTRUM UND DEN ANFANGSENERGIEN NEGATIVER SEKUNDARIONEN
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[8] OBSERVATION ON SURFACE-REACTIONS WITH STATIC METHOD OF SECONDARY ION MASS-SPECTROMETRY .1. METHOD
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[9] SECONDARY ION YIELDS NEAR 1 FOR SOME CHEMICAL COMPOUNDS
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[10] SURFACE INVESTIGATION OF SOLIDS BY STATICAL METHOD OF SECONDARY ION MASS SPECTROSCOPY (SIMS)
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