INTERATOMIC POTENTIALS FOR AL-CU-AG SOLID-SOLUTIONS

A set of embedded atom method (EAM) interatomic potentials for dilute Al-Cu-Ag solid solutions has been developed. These potentials reproduce the experimental elastic constants, stacking fault energies, vacancy formation energies, and migration energies of the pure metals, as well as the migration energies of Cu and Ag in Al and the dependence of host lattice parameter on solid solution composition. With these potentials, simulations can be carried out which may provide insight into such phenomena as interface segregation, the influence of composition on stacking faults, and dislocation-solute interactions in binary Al-Cu, Al-Ag, and Cu-Ag and ternary Al-Cu-Ag solid solutions.