(100) ORIENTED POLY-SI FILM GROWN BY ULTRAHIGH-VACUUM CHEMICAL-VAPOR-DEPOSITION

被引:7
作者
TANIKAWA, A
TATSUMI, T
机构
[1] NEC Corporation, Microelectronics Research Laboratories, Tsukuba, Ibaraki 305
关键词
D O I
10.1149/1.2059242
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
Poly-Si films are grown by ultrahigh vacuum chemical vapor deposition (UHV-CVD) with plasma-seeding on SiO2. The preferred grain orientations are investigated as a function of thickness, source gas flow rate, and growth temperature. The poly-Si films show (100) preferred orientation in a wide range of growth conditions. The (100) orientation increases as thickness and flow rate increases and decreases as temperature increases. UHV-CVD and other deposition methods are compared in order to estimate the role of hydrogen and oxygen as factors controlling the preferred grain orientation.
引用
收藏
页码:2848 / 2851
页数:4
相关论文
共 10 条
[1]   SELECTIVE EPITAXIAL-GROWTH OF SI AND SI1-XGEX FILMS BY ULTRAHIGH-VACUUM CHEMICAL VAPOR-DEPOSITION USING SI2H6 AND GEH4 [J].
AKETAGAWA, K ;
TATSUMI, T ;
HIROI, M ;
NIINO, T ;
SAKAI, J .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1992, 31 (5A) :1432-1435
[2]   EFFECTS OF SUBSTRATE-TEMPERATURE ON THE ORIENTATION OF ULTRAHIGH-VACUUM EVAPORATE SI AND GE FILMS [J].
CHAO, SS ;
GONZALEZHERNANDEZ, J ;
MARTIN, D ;
TSU, R .
APPLIED PHYSICS LETTERS, 1985, 46 (11) :1089-1091
[3]  
Cullity BD., 1978, ELEMENTS XRAY DIFFRA, P107
[4]  
CULLITY DB, 1978, ELEMENTS XRAY DIFFRA, P189
[5]   GROWTH AND PHYSICAL-PROPERTIES OF LPCVD POLYCRYSTALLINE SILICON FILMS [J].
HARBEKE, G ;
KRAUSBAUER, L ;
STEIGMEIER, EF ;
WIDMER, AE ;
KAPPERT, HF ;
NEUGEBAUER, G .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1984, 131 (03) :675-682
[6]   STRUCTURE AND STABILITY OF LOW-PRESSURE CHEMICALLY VAPOR-DEPOSITED SILICON FILMS [J].
KAMINS, TI ;
MANDURAH, MM ;
SARASWAT, KC .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1978, 125 (06) :927-932
[7]   STRUCTURE AND PROPERTIES OF LPCVD SILICON FILMS [J].
KAMINS, TI .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1980, 127 (03) :686-690
[8]   INFLUENCE OF AS-DEPOSITED FILM STRUCTURE ON (100) TEXTURE IN LASER-RECRYSTALLIZED SILICON ON FUSED QUARTZ [J].
KIMURA, M ;
EGAMI, K .
APPLIED PHYSICS LETTERS, 1984, 44 (04) :420-422
[9]   LOW-TEMPERATURE FORMATION OF POLYCRYSTALLINE SILICON FILMS BY MOLECULAR-BEAM DEPOSITION [J].
MATSUI, M ;
SHIRAKI, Y ;
MARUYAMA, E .
JOURNAL OF APPLIED PHYSICS, 1982, 53 (02) :995-998
[10]   ACCURATE STRUCTURE-ANALYSIS BY THE MAXIMUM-ENTROPY METHOD [J].
SAKATA, M ;
SATO, M .
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 1990, 46 :263-270