DIRECT MEASUREMENT BY SECONDARY-ION MASS-SPECTROMETRY OF SELF-DIFFUSION OF BORON IN FE40NI40B20 GLASS

被引:88
作者
CAHN, RW
EVETTS, JE
PATTERSON, J
SOMEKH, RE
JACKSON, CK
机构
[1] CAMBRIDGE UNIV,DEPT MET & MAT SCI,CAMBRIDGE CB2 2QZ,ENGLAND
[2] ATOM ENERGY RES ESTAB,DIV MAT DEV,HARWELL OX11 0RA,ENGLAND
关键词
D O I
10.1007/BF00551737
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:702 / 710
页数:9
相关论文
共 25 条
[1]   CRYSTALLIZATION AND IRRADIATION EFFECTS OF AMORPHOUS FE40NI38MO4B18 ALLOY [J].
AZAM, N ;
LENAOUR, L ;
RIVERA, C ;
GROSJEAN, P ;
SACOVY, P ;
DELAPLACE, J .
JOURNAL OF NUCLEAR MATERIALS, 1979, 83 (02) :298-304
[2]   ATOMIC DIFFUSION OF LITHIUM IN AMORPHOUS METALLIC ALLOY PD-SI [J].
BIRAC, C ;
LESUEUR, D .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1976, 36 (01) :247-251
[3]  
BREBEC G, ACTA MET
[4]  
CAHN RW, 1979, 21E C MET SACL
[5]   DIFFUSION IN A PD-CU-SI METALLIC GLASS [J].
CHEN, HS ;
KIMERLING, LC ;
POATE, JM ;
BROWN, WL .
APPLIED PHYSICS LETTERS, 1978, 32 (08) :461-463
[6]  
Coburn J. W., 1974, Critical Reviews in Solid State Sciences, V4, P561, DOI 10.1080/10408437308245843
[7]  
CONTAMIN P, 1968, CR ACAD SCI C CHIM, V267, P805
[8]  
DEARNALEY G, 1979, COMMUNICATION
[9]  
DENIS HJ, 1978, THESIS RUHR U
[10]   APPLICATION OF ION MICROPROBE ANALYZER TO MEASUREMENT OF DISTRIBUTION OF BORON IONS IMPLANTED INTO SILICON CRYSTALS [J].
GITTINS, RP ;
DEARNALEY, G ;
MORGAN, DV .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1972, 5 (09) :1654-+