PROFILE MEASUREMENT USING PROJECTION OF RUNNING FRINGES

被引：81

作者：

INDEBETOUW, G ^{[1
]}

机构：

[1] UNIV BERN,INST APPL PHYS,CH-3001 BERN,SWITZERLAND

来源：

APPLIED OPTICS | 1978年 / 17卷 / 18期

关键词：

D O I：

10.1364/AO.17.002930

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

A method of profile control or measurement using projected fringes is presented. The fringes are dynamically translated over the object, and the phase of the signal picked up at a selected point on the surface is used to determine the depth or the depth error of the profile at this point. The method has the advantage of being contact-free, fast, accurate, and easily automated. © 1978 Optical Society of America.

引用

收藏

页码：2930 / 2933

页数：4

相关论文

共 10 条

[1] CHARACTERIZATION AND CONTROL OF 3-DIMENSIONAL OBJECTS USING FRINGE PROJECTION TECHNIQUES [J].

BENOIT, P ;

MATHIEU, E ;

HORMIERE, J ;

THOMAS, A .

NOUVELLE REVUE D OPTIQUE, 1975, 6 (02) :67-86

[2] ELECTRO-OPTIC LIGHT MODULATION WITH CUBIC CRYSTALS [J].

BUHRER, CF ;

BLOOM, LR ;

BAIRD, DH .

APPLIED OPTICS, 1963, 2 (08) :839-846

[3] ROTATING-WAVEPLATE OPTICAL-FREQUENCY SHIFTING IN LITHIUM NIOBATE [J].

CAMPBELL, JP ;

STEIER, WH .

IEEE JOURNAL OF QUANTUM ELECTRONICS, 1971, QE 7 (09) :450-&

[4]

CRANE R, 1969, APPL OPTICS, V8, P538

[5]

Dandliker R., 1973, Optics Communications, V9, P412, DOI 10.1016/0030-4018(73)90284-8

[6] REAL-TIME FRINGE METHOD AND ITS INDUSTRIAL APPLICATIONS - DEFORMATIONS, VIBRATIONS, RELIEF CURVES [J].

DESSUS, B ;

GERARDIN, JP ;

MOUSSELET, P .

OPTICAL AND QUANTUM ELECTRONICS, 1975, 7 (01) :15-45

[7] SCANNING MOIRE METHOD AND AUTOMATIC-MEASUREMENT OF 3-D SHAPES [J].

IDESAWA, M ;

YATAGAI, T ;

SOMA, T .

APPLIED OPTICS, 1977, 16 (08) :2152-2162

[8] OPTICAL FREQUENCY SHIFTING BY MEANS OF A ROTATING DIFFRACTION GRATING [J].

STEVENSON, WH .

APPLIED OPTICS, 1970, 9 (03) :649-+

[9]

TSCHUDI T, 1976 I APPL PHYS INT

[10]

VARNER JR, 1975, HOLOGRAPHIC NONDESTR, P105