FORCE MICROSCOPE USING A FIBER-OPTIC DISPLACEMENT SENSOR

被引：228

作者：

RUGAR, D

MAMIN, HJ

ERLANDSSON, R

STERN, JE

TERRIS, BD

机构：

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1988年 / 59卷 / 11期

关键词：

D O I：

10.1063/1.1139958

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：2337 / 2340

页数：4

共 15 条

[1] ATOMIC RESOLUTION IMAGING OF A NONCONDUCTOR BY ATOMIC FORCE MICROSCOPY [J].

ALBRECHT, TR ;

QUATE, CF .

JOURNAL OF APPLIED PHYSICS, 1987, 62 (07) :2599-2602

[2]

AMER NM, 1988, B AM PHYS SOC, V33, P319

[3] ATOMIC FORCE MICROSCOPE [J].

BINNIG, G ;

QUATE, CF ;

GERBER, C .

PHYSICAL REVIEW LETTERS, 1986, 56 (09) :930-933

[4] ATOMIC RESOLUTION WITH ATOMIC FORCE MICROSCOPE [J].

BINNIG, G ;

GERBER, C ;

STOLL, E ;

ALBRECHT, TR ;

QUATE, CF .

EUROPHYSICS LETTERS, 1987, 3 (12) :1281-1286

[5] FIBER-OPTIC INTERFEROMETER FOR REMOTE SUBANGSTROM VIBRATION MEASUREMENT [J].

DRAKE, AD ;

LEINER, DC .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1984, 55 (02) :162-165

[6] ATOMIC FORCE MICROSCOPY USING OPTICAL INTERFEROMETRY [J].

ERLANDSSON, R ;

MCCLELLAND, GM ;

MATE, CM ;

CHIANG, S .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (02) :266-270

[7] SINGLE-MODE FIBER FRACTIONAL WAVE DEVICES AND POLARIZATION CONTROLLERS [J].

LEFEVRE, HC .

ELECTRONICS LETTERS, 1980, 16 (20) :778-780

[8]

MAMIN HJ, UNPUB

[9] ATOMIC FORCE MICROSCOPY OF LIQUID-COVERED SURFACES - ATOMIC RESOLUTION IMAGES [J].

MARTI, O ;

DRAKE, B ;

HANSMA, PK .

APPLIED PHYSICS LETTERS, 1987, 51 (07) :484-486

[10] HIGH-RESOLUTION MAGNETIC IMAGING OF DOMAINS IN TBFE BY FORCE MICROSCOPY [J].

MARTIN, Y ;

RUGAR, D ;

WICKRAMASINGHE, HK .

APPLIED PHYSICS LETTERS, 1988, 52 (03) :244-246

← 1 2 →