SLOW SCAN DISPLAY SYSTEM FOR A SCANNING ELECTRON-MICROSCOPE

被引:15
作者
BECK, V [1 ]
机构
[1] UNIV CHICAGO,ENRICO FERMI INST,CHICAGO,IL 60637
关键词
D O I
10.1063/1.1686301
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:1064 / 1066
页数:3
相关论文
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[4]   HIGH RESOLUTION ELECTRON SPECTROMETER FOR USE IN TRANSMISSION SCANNING ELECTRON MICROSCOPY [J].
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