CAPACITANCE OF DISK CAPACITORS

被引:48
作者
NISHIYAMA, H [1 ]
NAKAMURA, M [1 ]
机构
[1] TAMAGAWA UNIV, DEPT ELECTR ENGN, TOKYO 194, JAPAN
来源
IEEE TRANSACTIONS ON COMPONENTS HYBRIDS AND MANUFACTURING TECHNOLOGY | 1993年 / 16卷 / 03期
关键词
D O I
10.1109/33.232065
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The capacitance of a parallel plate capacitor is formulated in basic electrostatics, assuming that the separation between the two electrode plates is very narrow and the fringe field of the edges is negligible. However, in practical problems of electrical and electronic engineering there are many cases where the plate separation is wide and the fringe field effect cannot be neglected. In our previously published paper the capacitance of strip capacitor was computed by the boundary element method (BEM) for the case where the separation becomes wide, and a new empirical formula of the capacitance against the plate separation was derived. The empirical formula agreed well with experimental data. This paper presents a ''formula'' for the capacitance of a parallel plate disk capacitor. The ''formula'' is valid over a wider separation than formulas presented previously. As a special case of the problem, the capacitance of parallel plate ring capacitors is computed by the BEM.
引用
收藏
页码:360 / 366
页数:7
相关论文
共 16 条
[1]  
ATKINSON KE, 1989, INTRO NUMERICAL ANAL
[2]   DESIGN RULES FOR MICROSTRIP CAPACITANCE [J].
BOGATIN, E .
IEEE TRANSACTIONS ON COMPONENTS HYBRIDS AND MANUFACTURING TECHNOLOGY, 1988, 11 (03) :253-259
[3]  
Brebbia C.A., 1984, BOUNDARY ELEMENT TEC
[4]  
BREBBIA CA, 1978, BOUNDARY ELEMENT ENG
[5]  
Bulirsch R., 1965, NUMER MATH, V7, P78, DOI DOI 10.1007/BF01397975
[6]   OPEN TRANSMISSION-LINE UHF CW PHASE TECHNIQUE FOR THICKNESS-DIELECTRIC CONSTANT MEASUREMENT [J].
CHUDOBIAK, WJ ;
BESHIR, MR ;
WIGHT, JS .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1979, 28 (01) :18-25
[7]   PROPERTIES OF MICROSTRIP LINE ON SI-SIO2 SYSTEM [J].
HASEGAWA, H ;
FURUKAWA, M ;
YANAI, H .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1971, MT19 (11) :869-+
[8]   OPTIMUM FORM OF CAPACITIVE TRANSDUCER FOR DISPLACEMENT MEASUREMENT [J].
HIRASAWA, M ;
NAKAMURA, M ;
KANNO, M .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1984, 33 (04) :276-280
[9]  
KIRCHHOFF G, 1877, MONATSB DTSCH AKAD W, P144
[10]  
Landau L. D., ELECTRODYNAMICS CONT, V2nd