HIGH-SPATIAL-RESOLUTION XAFS AND ITS IMAGING APPLICATIONS

被引：17

作者：

IIDA, A

NOMA, T

HAYAKAWA, S

TAKAHASHI, M

GOHSHI, Y

机构：

[1] CANON INC,CANON RES CTR,KANAGAWA 24301,JAPAN

[2] UNIV TOKYO,DEPT IND CHEM,TOKYO 113,JAPAN

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1993年 / 32卷

关键词：

X-RAY MICROBEAM; MICRO-XAFS; IMAGING; SELF-ABSORPTION; CHEMICAL STATE;

D O I：

10.7567/JJAPS.32S2.160

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A synchrotron X-ray microprobe has been applied to XAFS measurements over a small region. Either an ellipsoidal mirror or a modified Kirkpatrick-Baez configuration is used as an X-ray focusing element in combination with a double crystal monochromator. The X-ray beam size at the sample is around 5 mum with a photon flux of 10(7) to 10(8) photons/s/300 mA. Minerals in thin sections of rock samples have been analyzed. For analysis of practical samples, fluorescence detection is useful and effective. Deformation of the XAFS spectrum due to a self-absorption effect has been experimentally minimized using the small exit-angle condition; it can also be numerically corrected using physical parameters. Chemical state imaging has also been carried out using the chemical shift of the absorption edge. Lateral distributions of magnetite and hematite in a sintered iron ore have been obtained.

引用

页码：160 / 164

页数：5

共 31 条

[1] IMAGES OF A MICROELECTRONIC DEVICE WITH THE X1-SPEM, A 1ST GENERATION SCANNING PHOTOEMISSION MICROSCOPE AT THE NATIONAL SYNCHROTRON LIGHT-SOURCE [J].