ULTRAHARD COATINGS FROM TI-BN MULTILAYERS AND BY COSPUTTERING

被引:42
作者
FRIESEN, T
HAUPT, J
GISSLER, W
BARNA, A
BARNA, PB
机构
[1] COMMISS EUROPEAN COMMUNITIES,INST ADV MAT,JOINT RES CTR,CP 1,I-21020 ISPRA,ITALY
[2] HUNGARIAN ACAD SCI,TECH PHYS RES INST,H-1325 BUDAPEST,HUNGARY
关键词
D O I
10.1016/0257-8972(91)90141-I
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Two new techniques for the preparation of very hard Ti-B-N coatings are presented. The first method is accomplished in two steps: (i) the deposition of a multilayer coating of the sequence Ti-BN by reactive or non-reactive sputtering from a titanium and a hexagonal BN target respectively; (ii) a subsequent thermal treatment of the multilayer to induce a diffusion-activated mixing process between the titanium and BN layers with consequent phase transformations. The coatings were characterized with respect to stoichiometry by X-ray photoelectron spectroscopy with respect to structure by glancing angle X-ray diffractometry and with respect to hardness and residual stress by micro-indentation and the substrate-bending method respectively. Hardness values up to 6000 HV were observed at a concentration ratio [Ti]:[B]:[N] = 1:0.5:0.4. The coating with this compositional ratio is assumed to comprise a mixture of two solid solutions of the type Ti(Bx,Ny) and TiN1-x(By). This new technique has the advantage that almost stress-free coatings with good adhesion to metallic and non-metallic substrates are obtained. The second method is a co-sputtering process from a titanium and BN target. With this method coatings of considerable compressive stress are obtained.
引用
收藏
页码:169 / 174
页数:6
相关论文
共 20 条
[1]  
[Anonymous], 1961, XRAY METALLOGRAPHY
[2]   ANALYSIS OF THE DEVELOPMENT OF LARGE AREA SURFACE-TOPOGRAPHY DURING ION ETCHING [J].
BARNA, A ;
BARNA, PB ;
ZALAR, A .
VACUUM, 1990, 40 (1-2) :115-120
[3]  
BARNA A, 1984, 8TH P EUR C EL MICR, V1, P107
[4]   COMPARATIVE-STUDY OF TINX FILMS DEPOSITED BY REACTIVE ION-BEAM SPUTTERING AT 77-K AND 300-K [J].
BUSCHERT, RC ;
GIBSON, PN ;
GISSLER, W ;
HAUPT, J ;
MANARA, A ;
JIANG, X ;
REICHELT, K .
SURFACE AND INTERFACE ANALYSIS, 1990, 16 (1-12) :510-514
[5]  
BUSCHERT RC, 1989, J PHYS COLL PARIS, V7, P168
[6]  
DEARNALY G, 1988, Patent No. 2197346
[7]  
FREY H, 1987, DUNNSCHICHTTECHNOLOG
[8]   MIXED PHASE NANOCRYSTALLINE BORON-NITRIDE FILMS - PREPARATION AND CHARACTERIZATION [J].
GISSLER, W ;
HAUPT, J ;
HOFFMANN, A ;
GIBSON, PN ;
RICKERBY, DG .
THIN SOLID FILMS, 1991, 199 (01) :113-122
[9]  
HAEFER RA, 1987, OBERFLACHEN DUNNSC 1, P31
[10]  
HELLWEGE KH, 1976, LANDOLTBORNSTEIN, V7