MEASUREMENT OF DIELECTRIC PARAMETERS AT MICROWAVE-FREQUENCIES BY CAVITY-PERTURBATION TECHNIQUE

被引：82

作者：

PARKASH, A

VAID, JK

MANSINGH, A

机构：

[1] UNIV DELHI,HINDU COLL,DELHI 110007,INDIA

[2] UNIV DELHI,DEPT PHYS & ASTROPHYS,DELHI 110007,INDIA

来源：

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 1979年 / 27卷 / 09期

关键词：

D O I：

10.1109/TMTT.1979.1129731

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：791 / 795

页数：5

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