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STOCHASTIC GEOMETRY-EFFECTS IN MOS-TRANSISTORS - COMMENT
被引:0
作者
:
ZOMBORY, L
论文数:
0
引用数:
0
h-index:
0
机构:
Budapest Technical Univ, Hung, Budapest Technical Univ, Hung
ZOMBORY, L
机构
:
[1]
Budapest Technical Univ, Hung, Budapest Technical Univ, Hung
来源
:
IEEE JOURNAL OF SOLID-STATE CIRCUITS
|
1987年
/ 22卷
/ 02期
关键词
:
DRAIN CURRENT VARIANCE FORMULATION - EDGE EFFECT - NONRECTANGULAR-GATE MOS TRANSISTORS - OXIDE THICKNESS VARIATION - STOCHASTIC GEOMETRY EFFECTS;
D O I
:
10.1109/JSSC.1987.1052720
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:303 / 305
页数:3
相关论文
共 4 条
[1]
MODELING OF MOS-TRANSISTORS WITH NONRECTANGULAR GATE GEOMETRIES - COMMENT
DEMEY, G
论文数:
0
引用数:
0
h-index:
0
DEMEY, G
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1983,
30
(07)
: 862
-
863
[2]
STOCHASTIC GEOMETRY-EFFECTS IN MOS-TRANSISTORS
DEMEY, G
论文数:
0
引用数:
0
h-index:
0
DEMEY, G
[J].
IEEE JOURNAL OF SOLID-STATE CIRCUITS,
1985,
20
(04)
: 865
-
870
[3]
MODELING OF MOS-TRANSISTORS WITH NON-RECTANGULAR-GATE GEOMETRIES
GRIGNOUX, P
论文数:
0
引用数:
0
h-index:
0
机构:
TEXAS A&M UNIV, DEPT ELECT ENGN, COLLEGE STN, TX 77843 USA
TEXAS A&M UNIV, DEPT ELECT ENGN, COLLEGE STN, TX 77843 USA
GRIGNOUX, P
GEIGER, RL
论文数:
0
引用数:
0
h-index:
0
机构:
TEXAS A&M UNIV, DEPT ELECT ENGN, COLLEGE STN, TX 77843 USA
TEXAS A&M UNIV, DEPT ELECT ENGN, COLLEGE STN, TX 77843 USA
GEIGER, RL
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1982,
29
(08)
: 1261
-
1269
[4]
ZOMBORY L, 1978, 6TH P COLL MICR COMM, V1
←
1
→
共 4 条
[1]
MODELING OF MOS-TRANSISTORS WITH NONRECTANGULAR GATE GEOMETRIES - COMMENT
DEMEY, G
论文数:
0
引用数:
0
h-index:
0
DEMEY, G
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1983,
30
(07)
: 862
-
863
[2]
STOCHASTIC GEOMETRY-EFFECTS IN MOS-TRANSISTORS
DEMEY, G
论文数:
0
引用数:
0
h-index:
0
DEMEY, G
[J].
IEEE JOURNAL OF SOLID-STATE CIRCUITS,
1985,
20
(04)
: 865
-
870
[3]
MODELING OF MOS-TRANSISTORS WITH NON-RECTANGULAR-GATE GEOMETRIES
GRIGNOUX, P
论文数:
0
引用数:
0
h-index:
0
机构:
TEXAS A&M UNIV, DEPT ELECT ENGN, COLLEGE STN, TX 77843 USA
TEXAS A&M UNIV, DEPT ELECT ENGN, COLLEGE STN, TX 77843 USA
GRIGNOUX, P
GEIGER, RL
论文数:
0
引用数:
0
h-index:
0
机构:
TEXAS A&M UNIV, DEPT ELECT ENGN, COLLEGE STN, TX 77843 USA
TEXAS A&M UNIV, DEPT ELECT ENGN, COLLEGE STN, TX 77843 USA
GEIGER, RL
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1982,
29
(08)
: 1261
-
1269
[4]
ZOMBORY L, 1978, 6TH P COLL MICR COMM, V1
←
1
→