STATISTICAL-ANALYSIS OF X-RAY RESIDUAL-STRESS MEASUREMENT USING THE HALF-WIDTH METHOD

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作者：
KURITA, M
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JOURNAL OF TESTING AND EVALUATION | 1982年 / 10卷 / 02期
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TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
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页码：38 / 46
页数：9
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