TIME AND TEMPERATURE RESOLVED X-RAY-DIFFRACTION FOR STUDIES OF SOLID-STATE REACTIONS AND PHASE-TRANSITIONS

被引：1

作者：

JUEZLORENZO, M ^{[1
]}

KOLARIK, V ^{[1
]}

HERRMANN, M ^{[1
]}

ENGEL, W ^{[1
]}

EISENREICH, N ^{[1
]}

机构：

[1] FRAUNHOFER INST CHEM TECHNOL,D-76327 BERGHAUSEN,GERMANY

来源：

FRESENIUS JOURNAL OF ANALYTICAL CHEMISTRY | 1994年 / 349卷 / 1-3期

关键词：

D O I：

10.1007/BF00323252

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

Three examples for the application of time and temperature resolved X-ray diffraction for the investigation of solid state reactions and phase transitions are given. Samples were submitted to an isothermal temperature program or to stepwise heating/cooling, while diffraction patterns were measured continuously. The applications include the in situ identification of reaction products or phases, the determination of kinetic parameters, the observation of thermal expansion and the formation of layers.

引用

页码：163 / 165

页数：3

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