TEMPERATURE-COEFFICIENT OF RESISTIVITY FOR POLYCRYSTALLINE CU-FILMS

被引：8

作者：

MANNAN, KM ^{[1
]}

机构：

[1] UNIV DACCA,DEPT PHYS,DACCA 2,BANGLADESH

来源：

PHYSICS LETTERS A | 1977年 / 62卷 / 07期

关键词：

D O I：

10.1016/0375-9601(77)90088-3

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：519 / 520

页数：2

共 11 条

[1]

DAKKER AJ, 1970, SOLID STATE PHYSICS, P284

[2] The conductivity of thin metallic films according to the electron theory of metals [J].

Fuchs, K .

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[3] TEMPERATURE COEFFICIENT OF RESISTIVITY OF POLYCRYSTALLINE FILMS [J].

JOGLEKAR, AV ;

KAREKAR, RN ;

SATHIANANDAN, K .

PHYSICS LETTERS A, 1973, A 45 (05) :391-392

[4] GROWTH, ENVIRONMENTAL, AND ELECTRICAL PROPERTIES OF ULTRATHIN METAL-FILMS [J].

KAZMERSKI, LL ;

RACINE, DM .

JOURNAL OF APPLIED PHYSICS, 1975, 46 (02) :791-795

[5]

KITTEL C, 1971, INTRO SOLID STATE PH, P259

[6] GRAIN-BOUNDARY CONTRIBUTION TO ELECTRICAL-CONDUCTIVITY OF POLYCRYSTALLINE CU FILMS [J].

MANNAN, KM ;

KARIM, KR .

JOURNAL OF PHYSICS F-METAL PHYSICS, 1975, 5 (09) :1687-1693

[7] STRUCTURAL PARAMETERS OF CU FILMS [J].

MANNAN, KM ;

CHAKRAVARTY, B .

NUOVO CIMENTO DELLA SOCIETA ITALIANA DI FISICA B-GENERAL PHYSICS RELATIVITY ASTRONOMY AND MATHEMATICAL PHYSICS AND METHODS, 1975, B 26 (01) :148-156

[8] ELECTRICAL-RESISTIVITY MODEL FOR POLYCRYSTALLINE FILMS - CASE OF ARBITRARY REFLECTION AT EXTERNAL SURFACES [J].

MAYADAS, AF ;

SHATZKES, M .

PHYSICAL REVIEW B, 1970, 1 (04) :1382-&

[9]

RITUSURI AP, 1975, J APPL PHYS, V46, P2574

[10]

SINGH A, 1974, J APPL PHYS, V45, P1904

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