MASS SPECTROSCOPIC IDENTIFICATION OF WAVELENGTH DEPENDENT UV LASER PHOTOABLATION FRAGMENTS FROM POLYMETHYLMETHACRYLATE

被引:67
作者
ESTLER, RC [1 ]
NOGAR, NS [1 ]
机构
[1] UNIV CALIF LOS ALAMOS NATL LAB,DIV CHEM,LOS ALAMOS,NM 87545
关键词
D O I
10.1063/1.97406
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
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页码:1175 / 1177
页数:3
相关论文
共 18 条
[1]   DIRECT ETCHING OF POLYMERIC MATERIALS USING A XECL LASER [J].
ANDREW, JE ;
DYER, PE ;
FORSTER, D ;
KEY, PH .
APPLIED PHYSICS LETTERS, 1983, 43 (08) :717-719
[2]   STIMULATED RAMAN EFFECT [J].
BLOEMBERGEN, N .
AMERICAN JOURNAL OF PHYSICS, 1967, 35 (11) :989-+
[3]   VELOCITY DISTRIBUTION OF MOLECULAR FRAGMENTS FROM POLYMETHYLMETHACRYLATE IRRADIATED WITH UV LASER-PULSES [J].
DANIELZIK, B ;
FABRICIUS, N ;
ROWEKAMP, M ;
VONDERLINDE, D .
APPLIED PHYSICS LETTERS, 1986, 48 (03) :212-214
[4]   SPECTROSCOPIC STUDIES OF ARF LASER PHOTOABLATION OF PMMA [J].
DAVIS, GM ;
GOWER, MC ;
FOTAKIS, C ;
EFTHIMIOPOULOS, T ;
ARGYRAKIS, P .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1985, 36 (01) :27-30
[5]   PHOTOLYTIC DEGRADATION OF POLY(METHYL METHACRYLATE) [J].
FOX, RB ;
ISAACS, LG ;
STOKES, S .
JOURNAL OF POLYMER SCIENCE PART A-GENERAL PAPERS, 1963, 1 (03) :1079-&
[6]   LASER ABLATION OF ORGANIC POLYMERS - MICROSCOPIC MODELS FOR PHOTOCHEMICAL AND THERMAL-PROCESSES [J].
GARRISON, BJ ;
SRINIVASAN, R .
JOURNAL OF APPLIED PHYSICS, 1985, 57 (08) :2909-2914
[7]   MICROSCOPIC MODEL FOR THE ABLATIVE PHOTODECOMPOSITION OF POLYMERS BY FAR-ULTRAVIOLET RADIATION (193 NM) [J].
GARRISON, BJ ;
SRINIVASAN, R .
APPLIED PHYSICS LETTERS, 1984, 44 (09) :849-851
[8]   EMISSION-SPECTRA, SURFACE QUALITY, AND MECHANISM OF EXCIMER LASER ETCHING OF POLYIMIDE FILMS [J].
KOREN, G ;
YEH, JTC .
APPLIED PHYSICS LETTERS, 1984, 44 (12) :1112-1114
[9]   SURFACE-PROPERTIES OF POLY(ETHYLENE-TEREPHTHALATE) FILMS MODIFIED BY FAR-ULTRAVIOLET RADIATION AT 193-NM (LASER) AND 185-NM (LOW INTENSITY) [J].
LAZARE, S ;
SRINIVASAN, R .
JOURNAL OF PHYSICAL CHEMISTRY, 1986, 90 (10) :2124-2131
[10]   DEEP UV LITHOGRAPHY [J].
LIN, BJ .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1975, 12 (06) :1317-1320