CHEMICAL IMAGING BY SCANNING FORCE MICROSCOPY

被引：93

作者：

AKARI, S ^{[1
]}

HORN, D ^{[1
]}

KELLER, H ^{[1
]}

SCHREPP, W ^{[1
]}

机构：

[1] BASF AG,DIV POLYMER RES,D-67056 LUDWIGSHAFEN,GERMANY

来源：

ADVANCED MATERIALS | 1995年 / 7卷 / 06期

关键词：

D O I：

10.1002/adma.19950070607

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

The chemical imaging of surfaces with high lateral resolution (i.e. the chemical identification of the materials which make up the surface was recently reported by Lieber et al. in Science. Here, work carried out partially in parallel using chemically modified SFM tips (see Figure) confirms the power of the technique and emphasizes its use for technical surfaces which normally show little contrast in SFM.

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页码：549 / 551

页数：3

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共 16 条

[1] PHOTOINDUCED TUNNELING SPECTROSCOPY OF RES2 - DRAMATIC INCREASE OF THE QUANTUM EFFICIENCY BY CHEMICAL TREATMENT [J].

AKARI, S ;

FRIEMELT, K ;

GLOCKLER, K ;

LUXSTEINER, MC ;

BUCHER, E ;

DRANSFELD, K .

APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1993, 57 (03) :221-223

[2] IMAGING OF SINGLE POLYMER-CHAINS BASED ON THEIR ELASTICITY [J].

AKARI, SO ;

VANDERVEGTE, EW ;

GRIM, PCM ;

BELDER, GF ;

KOUTSOS, V ;

TENBRINKE, G ;

HADZIIOANNOU, G .

APPLIED PHYSICS LETTERS, 1994, 65 (15) :1915-1917

[3] SURFACE STUDIES BY SCANNING TUNNELING MICROSCOPY [J].

BINNING, G ;

ROHRER, H ;

GERBER, C ;

WEIBEL, E .

PHYSICAL REVIEW LETTERS, 1982, 49 (01) :57-61

[4] MEASURING THE NANOMECHANICAL PROPERTIES AND SURFACE FORCES OF MATERIALS USING AN ATOMIC FORCE MICROSCOPE [J].

BURNHAM, NA ;

COLTON, RJ .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1989, 7 (04) :2906-2913

[5] DOMAIN-STRUCTURES IN LANGMUIR-BLODGETT-FILMS INVESTIGATED BY ATOMIC FORCE MICROSCOPY [J].

CHI, LF ;

ANDERS, M ;

FUCHS, H ;

JOHNSTON, RR ;

RINGSDORF, H .

SCIENCE, 1993, 259 (5092) :213-216

[6] SCANNING PROBE MICROSCOPY FOR INDUSTRIAL APPLICATIONS - SELECTED EXAMPLES [J].

DAMMER, U ;

ANSELMETTI, D ;

DREIER, M ;

FROMMER, J ;

FUNFSCHILLING, J ;

GERTH, G ;

GUNTHERODT, HJ ;

HAEFKE, H ;

HIDBER, HR ;

HOWALD, L ;

HUG, HJ ;

JUNG, TH ;

LANG, HP ;

LUTHI, R ;

MEYER, E ;

MOSER, A ;

PARASHIKOV, I ;

REIMANN, P ;

RICHMOND, T ;

RUETSCHI, M ;

RUDIN, H ;

SCHWARZ, UD ;

STAUFER, U ;

SUM, R .

SCANNING, 1993, 15 (05) :257-264

[7] ADHESION FORCES BETWEEN INDIVIDUAL LIGAND-RECEPTOR PAIRS [J].

FLORIN, EL ;

MOY, VT ;

GAUB, HE .

SCIENCE, 1994, 264 (5157) :415-417

[8] FUNCTIONAL-GROUP IMAGING BY CHEMICAL FORCE MICROSCOPY [J].

FRISBIE, CD ;

ROZSNYAI, LF ;

NOY, A ;

WRIGHTON, MS ;

LIEBER, CM .

SCIENCE, 1994, 265 (5181) :2071-2074

[9] SCANNING TUNNELING MICROSCOPY AND ATOMIC FORCE MICROSCOPY IN ORGANIC-CHEMISTRY [J].

FROMMER, J .

ANGEWANDTE CHEMIE-INTERNATIONAL EDITION, 1992, 31 (10) :1298-1328

[10] SELF-ASSEMBLED ORGANIC FILMS ON GOLD AND SILVER [J].

KELLER, H ;

SCHREPP, W ;

FUCHS, H .

THIN SOLID FILMS, 1992, 210 (1-2) :799-802