X-RAY-DIFFRACTION INVESTIGATIONS ON ULTRA-THIN GOLD-FILMS

被引：15

作者：

HAUPL, K ^{[1
]}

LANG, M ^{[1
]}

WISSMANN, P ^{[1
]}

机构：

[1] UNIV ERLANGEN NURNBERG,INST PHYS & THEORET CHEM,EGERLANDSTR 3,D-8520 ERLANGEN,FED REP GER

来源：

SURFACE AND INTERFACE ANALYSIS | 1986年 / 9卷 / 1-6期

关键词：

LEED/AUGER TECHNIQUES - TEXTURE ANALYSIS - ULTRA-THIN GOLD FILMS - X-RAY DIFFRACTION;

D O I：

10.1002/sia.740090106

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：27 / 30

页数：4

共 18 条

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[5]

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[6]

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[7] DETERMINATION OF THICKNESS AND ROUGHNESS OF THIN COPPER-FILMS BY X-RAY-DIFFRACTION MEASUREMENTS [J].

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[8]

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[9]

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