Non-Resonant Waveguide Technique for Measurement of Microwave Complex Permittivity of Ferroelectrics and Related Materials

被引:0
作者
Jeong, Moongi [1 ]
Kim, Beomjin [1 ]
Poplavko, Yuriy [2 ]
Kazmirenko, Victor [2 ]
Prokopenko, Yuriy [2 ]
Baik, Sunggi [1 ]
机构
[1] Pohang Univ Sci & Technol, Dept Mat Sci & Engn, Pohang 790784, South Korea
[2] Natl Tech Univ Ukraine, Dept Microelect, UA-03056 Kiev, Ukraine
关键词
Microwave complex permittivity; Rectangular waveguide; Non-resonant; Short-circuit line; Transmission/Reflection;
D O I
10.4191/kcers.2005.42.7.449
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
A waveguide method is developed to study the materials with relatively large dielectric constants at microwave range. Basically, the method is similar to the previous waveguide methods represented by short-circuit line and transmission/reflection measurement methods. However, the complex permittivity is not determined by the shift in resonance frequencies, but by numerical analysis of measured scattering parameters. In order to enhance microwave penetration into the specimen with relatively large permittivity, a dielectric plate with lower permittivity is employed for impedance matching. The influences of air gap between the specimen and waveguide wall are evaluated, and the corresponding errors are estimated. The propagation of higher order modes is also considered. Experimental results for several reference ceramics are presented.
引用
收藏
页码:449 / 454
页数:6
相关论文
共 24 条
[1]  
Altshuller H. M., 1963, HDB MICROWAVE MEASUR, V2
[2]  
American Society for Testing and Materials, STAND TEST METH MEAS
[3]   Dielectric characterization of low-loss materials - A comparison of techniques [J].
Baker-Jarvis, J ;
Geyer, RG ;
Grosvenor, JH ;
Janezic, MD ;
Jones, CA ;
Riddle, B ;
Weil, CM ;
Krupka, J .
IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION, 1998, 5 (04) :571-577
[4]  
Baker-Jarvis J., 1990, TRANSMISSION REFLECT, P2
[5]   ANALYSIS OF AN OPEN-ENDED COAXIAL PROBE WITH LIFT-OFF FOR NONDESTRUCTIVE TESTING [J].
BAKERJARVIS, J ;
JANEZIC, MD ;
DOMICH, PD ;
GEYER, RG .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1994, 43 (05) :711-718
[6]   IMPROVED TECHNIQUE FOR DETERMINING COMPLEX PERMITTIVITY WITH THE TRANSMISSION REFLECTION METHOD [J].
BAKERJARVIS, J ;
VANZURA, EJ ;
KISSICK, WA .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1990, 38 (08) :1096-1103
[7]   A NONLINEAR LEAST-SQUARES SOLUTION WITH CAUSALITY CONSTRAINTS APPLIED TO TRANSMISSION-LINE PERMITTIVITY AND PERMEABILITY DETERMINATION [J].
BAKERJARVIS, J ;
GEYER, RG ;
DOMICH, PD .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1992, 41 (05) :646-652
[8]  
Balanis C. A., 1989, ADV ENG ELECTROMAGNE, P352
[9]   Accurate determination of the complex permittivity of materials with transmission reflection measurements in partially filled rectangular waveguides [J].
Catalá-Civera, JM ;
Canós, AJ ;
Peñaranda-Foix, FL ;
Davó, ED .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 2003, 51 (01) :16-24
[10]   GAP EFFECT IN MEASUREMENT OF LARGE PERMITTIVITIES [J].
CHAMPLIN, KS ;
GLOVER, GH .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1966, MT14 (08) :397-&