FAILURE OF ALUMINIUM CONTACTS TO SILICON IN SHALLOW DIFFUSED TRANSISTORS

被引：30
|
作者：
MCCARTHY, J
机构：
来源：
MICROELECTRONICS RELIABILITY | 1970年 / 9卷 / 02期
关键词：
D O I：
10.1016/0026-2714(70)90671-2
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：187 / &
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