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ACCURATE METALLIZATION CAPACITANCES FOR INTEGRATED-CIRCUITS AND PACKAGES
被引:32
作者
:
RUEHLI, AE
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
RUEHLI, AE
[
1
]
BRENNAN, PA
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
BRENNAN, PA
[
1
]
机构
:
[1]
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
来源
:
IEEE JOURNAL OF SOLID-STATE CIRCUITS
|
1973年
/ SC-8卷
/ 04期
关键词
:
D O I
:
10.1109/JSSC.1973.1050400
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:289 / 290
页数:2
相关论文
共 4 条
[1]
A GENERAL METHOD FOR OBTAINING IMPEDANCE AND COUPLING CHARACTERISTICS OF PRACTICAL MICROSTRIP AND TRIPLATE TRANSMISSION LINE CONFIGURATIONS
HILL, YM
论文数:
0
引用数:
0
h-index:
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HILL, YM
RECKORD, NO
论文数:
0
引用数:
0
h-index:
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RECKORD, NO
WINNER, DR
论文数:
0
引用数:
0
h-index:
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WINNER, DR
[J].
IBM JOURNAL OF RESEARCH AND DEVELOPMENT,
1969,
13
(03)
: 314
-
&
[2]
PATEL PD, 1971, IEEE T MICROW THEORY, VMT19, P862
[3]
RUEHLI AE, 1973, IEEE T MICROWAVE THE, VMT21, P76
[4]
WEEKS WT, 1970, IEEE T MICROW THEORY, VMT18, P35
←
1
→
共 4 条
[1]
A GENERAL METHOD FOR OBTAINING IMPEDANCE AND COUPLING CHARACTERISTICS OF PRACTICAL MICROSTRIP AND TRIPLATE TRANSMISSION LINE CONFIGURATIONS
HILL, YM
论文数:
0
引用数:
0
h-index:
0
HILL, YM
RECKORD, NO
论文数:
0
引用数:
0
h-index:
0
RECKORD, NO
WINNER, DR
论文数:
0
引用数:
0
h-index:
0
WINNER, DR
[J].
IBM JOURNAL OF RESEARCH AND DEVELOPMENT,
1969,
13
(03)
: 314
-
&
[2]
PATEL PD, 1971, IEEE T MICROW THEORY, VMT19, P862
[3]
RUEHLI AE, 1973, IEEE T MICROWAVE THE, VMT21, P76
[4]
WEEKS WT, 1970, IEEE T MICROW THEORY, VMT18, P35
←
1
→