IMAGE-CONTRAST IN NEAR-FIELD OPTICS

被引：72

作者：

TRAUTMAN, JK ^{[1
]}

BETZIG, E ^{[1
]}

WEINER, JS ^{[1
]}

DIGIOVANNI, DJ ^{[1
]}

HARRIS, TD ^{[1
]}

HELLMAN, F ^{[1
]}

GYORGY, EM ^{[1
]}

机构：

[1] UNIV CALIF SAN DIEGO,DEPT PHYS,LA JOLLA,CA 92093

来源：

JOURNAL OF APPLIED PHYSICS | 1992年 / 71卷 / 10期

关键词：

D O I：

10.1063/1.350655

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The resolution of optical microscopy can be extended beyond the diffraction limit by placing a source or detector of visible light having dimensions much smaller than the wavelength, lambda, in the near-field of the sample (< lambda/10). This technique, near-field scanning optical microscopy, is sensitive to a variety of important sample properties including optical density, refractive index, luminescence, and birefringence. Although image contrast based on certain sample characteristics is similar to that observed in traditional optical microscopy, strong coupling between the probe and sample often produces contrast unique to the near-field.

引用

页码：4659 / 4663

页数：5

共 25 条

[1] SUPER-RESOLUTION APERTURE SCANNING MICROSCOPE [J].