THERMAL EXPANSION OF SPUTTERED SILICON NITRIDE FILMS

被引:67
作者
BURKHARDT, PJ
MARVEL, RF
机构
[1] IBM Components Division, East Fishkill Laboratory, Hopewell Junction, New York
关键词
D O I
10.1149/1.2412081
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
[No abstract available]
引用
收藏
页码:864 / +
页数:1
相关论文
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