SECONDARY ION MASS-SPECTROMETRY - NEW ANALYTICAL TECHNIQUE FOR BIOLOGICALLY IMPORTANT COMPOUNDS

被引:114
作者
BENNINGHOVEN, A [1 ]
SICHTERMANN, W [1 ]
机构
[1] UNIV MUENSTER,INST PHYS,D-4400 MUENSTER,FED REP GER
来源
ORGANIC MASS SPECTROMETRY | 1977年 / 12卷 / 09期
关键词
D O I
10.1002/oms.1210120914
中图分类号
O62 [有机化学];
学科分类号
070303 ; 081704 ;
摘要
引用
收藏
页码:595 / 597
页数:3
相关论文
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[1]   DEVELOPMENTS IN SECONDARY ION MASS-SPECTROSCOPY AND APPLICATIONS TO SURFACE STUDIES [J].
BENNINGHOVEN, A .
SURFACE SCIENCE, 1975, 53 (DEC) :596-625
[2]   SECONDARY-ION EMISSION OF AMINO-ACIDS [J].
BENNINGHOVEN, A ;
JASPERS, D ;
SICHTERMANN, W .
APPLIED PHYSICS, 1976, 11 (01) :35-39
[3]  
BENNINGHOVEN A, 1977, ADV MASS SPECTROMETR, V7
[4]  
FALES HM, 1975, ANAL CHEM, V47, P207, DOI 10.1021/ac60352a049