X-RAY-ABSORPTION FINE-STRUCTURE IN EMBEDDED ATOMS

被引：192

作者：

REHR, JJ ^{[1
]}

BOOTH, CH ^{[1
]}

BRIDGES, F ^{[1
]}

ZABINSKY, SI ^{[1
]}

机构：

[1] UNIV CALIF SANTA CRUZ,SANTA CRUZ,CA 95064

来源：

PHYSICAL REVIEW B | 1994年 / 49卷 / 17期

关键词：

D O I：

10.1103/PhysRevB.49.12347

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Oscillatory structure is found in the atomic background absorption in x-ray-absorption fine-structure (XAFS) measurements. This atomic XAFS (AXAFS) arises from scattering within an embedded atom, and is analogous to the Ramsauer-Townsend effect. Calculations and measurements confirm the existence of AXAFS and show that it can dominate contributions such as multielectron excitations. The structure is sensitive to chemical effects and thus provides a probe of bonding and exchange effects on the scattering potential.

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页码：12347 / 12350

页数：4

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