REAL-SPACE IMAGING OF SINGLE-LAYER MOS2 BY SCANNING TUNNELING MICROSCOPY

被引：78
作者：
QIN, XR
YANG, D
FRINDT, RF
IRWIN, JC
机构：
[1] Department of Physics, Simon Fraser University, Burnaby
来源：
PHYSICAL REVIEW B | 1991年 / 44卷 / 07期
关键词：
D O I：
10.1103/PhysRevB.44.3490
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Single layers of MoS2 have been studied with a scanning tunneling microscope operating in air. The images obtained from films that were prepared by depositing an aqueous suspension of single-layer MoS2 on a graphite surface show that the unit cell of the single layers corresponds to an approximate 2a0 x a0 superlattice of the hexagonal 2H-MoS2 structure. The unit-cell parameters, in conjunction with previous measurements, imply that the single layers of MoS2 adopt a distorted octahedral structure. The image of dry restacked MoS2 transforms back to the hexagonal MoS2 pattern.
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页码：3490 / 3493
页数：4
相关论文
共 17 条
[1]  
BINNIG G, 1986, IBM J RES DEV, V30, P355
[2]   TUNNELING THROUGH A CONTROLLABLE VACUUM GAP [J].
BINNIG, G ;
ROHRER, H ;
GERBER, C ;
WEIBEL, E .
APPLIED PHYSICS LETTERS, 1982, 40 (02) :178-180
[3]   SURFACE STUDIES BY SCANNING TUNNELING MICROSCOPY [J].
BINNING, G ;
ROHRER, H ;
GERBER, C ;
WEIBEL, E .
PHYSICAL REVIEW LETTERS, 1982, 49 (01) :57-61
[4]   HIGH-STABILITY BIMORPH SCANNING TUNNELING MICROSCOPE [J].
BLACKFORD, BL ;
DAHN, DC ;
JERICHO, MH .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1987, 58 (08) :1343-1348
[5]   CRYSTAL STRUCTURES OF WTE2 AND HIGH-TEMPERATURE MOTE2 [J].
BROWN, BE .
ACTA CRYSTALLOGRAPHICA, 1966, 20 :268-&
[6]   SCANNING TUNNELING MICROSCOPY [J].
HANSMA, PK ;
TERSOFF, J .
JOURNAL OF APPLIED PHYSICS, 1987, 61 (02) :R1-R23
[7]   A STUDY OF SINGLE-LAYER AND RESTACKED MOS2 BY X-RAY-DIFFRACTION AND X-RAY ABSORPTION-SPECTROSCOPY [J].
JOENSEN, P ;
CROZIER, ED ;
ALBERDING, N ;
FRINDT, RF .
JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1987, 20 (26) :4043-4053
[8]   SINGLE-LAYER MOS2 [J].
JOENSEN, P ;
FRINDT, RF ;
MORRISON, SR .
MATERIALS RESEARCH BULLETIN, 1986, 21 (04) :457-461
[9]   IMAGING OF MOS2 BY SCANNING TUNNELING MICROSCOPY [J].
STUPIAN, GW ;
LEUNG, MS .
APPLIED PHYSICS LETTERS, 1987, 51 (19) :1560-1562
[10]   SURFACE VALENCE CHARGE-DISTRIBUTIONS AND SCANNING TUNNELING MICROSCOPY OF WTE2 [J].
TANG, SL ;
KASOWSKI, RV ;
SUNA, A ;
PARKINSON, BA .
SURFACE SCIENCE, 1990, 238 (1-3) :280-288
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