LOW FREQUENCY CURRENT FLUCTUATIONS IN A GAAS GUNN DIODE

被引:6
作者
MATSUNO, K
机构
[1] Central Research Laboratories, Nippon Electric Company, Ltd., Kawasaki
关键词
D O I
10.1063/1.1651875
中图分类号
O59 [应用物理学];
学科分类号
摘要
Low frequency noise spectrum and electrical conductivity of a GaAs Gunn diode are presented. Based on these results, we suggest that the observed FM noise spectrum of Gunn oscillators with -9 dB/octave slope of noise-to-carrier ratio may also be due to current fluctuations with l/f characteristic resulting from electron trapping. © 1968 The American Institute of Physics.
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页码:404 / &
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