COMPUTER-AIDED-DESIGN FOR INTEGRATED-CIRCUITS - TRYING TO BRIDGE THE GAP

被引:5
|
作者
DEMAN, HJ
机构
[1] Catholic Univerity of Leuven
关键词
D O I
10.1109/JSSC.1979.1051225
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this paper CAD performance in the field of simulation, testing, and layout is compared to the increase of digital integrated systems complexity. This complexity already exceeds the fundamental limits of existing software, especially in the testing area. On the other hand, fully manual layout of VLSI leads to unreasonably long design times and extremely high risks. This will favor design automation methods in layout. Testability and layout will most likely impose some sacrifice of VLSI overcapacity to a more structured system architecture. This architecture will lead to testable dedicated VLSI system design through the use of automated design software to keep development costs low. Copyright © 1979 by The Institute Of Electrical And Electronics Engineers, Inc.
引用
收藏
页码:613 / 621
页数:9
相关论文
共 50 条