INTERFACE ROUGHNESS AND PERIOD VARIATIONS IN MQW STRUCTURES DETERMINED BY X-RAY-DIFFRACTION

被引：60

作者：

FEWSTER, PF

机构：

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1988年 / 21卷

关键词：

D O I：

10.1107/S0021889888006569

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：524 / 529

页数：6

共 12 条

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