共 50 条
[1]
Residual stresses in alumina/silicon carbide (whisker) composites by X-ray diffraction
[J].
Abuhasan, Alias,
1600, (73)
[2]
Grain orientation measurement of passivated aluminum interconnects by X-ray micro diffraction
[J].
X-RAY MICROSCOPY, PROCEEDINGS,
2000, 507
:284-287
[4]
MEASUREMENT OF ORIENTATION RATE OF CRYSTALS IN CRYSTALLINE POLYMER BY DYNAMIC X-RAY DIFFRACTION
[J].
JOURNAL OF POLYMER SCIENCE PART B-POLYMER LETTERS,
1964, 2 (11P)
:1075-&
[6]
ON THE MEASUREMENT OF MACROSTRESSES BY X-RAY DIFFRACTION
[J].
SOVIET PHYSICS-TECHNICAL PHYSICS,
1956, 1 (10)
:2310-2315
[7]
STRESS MEASUREMENT BY X-RAY DIFFRACTION
[J].
JOURNAL OF APPLIED PHYSICS,
1954, 25 (11)
:1440-1440
[9]
ORIENTATION IN NYLON SPHERULITES - STUDY BY X-RAY DIFFRACTION
[J].
JOURNAL OF POLYMER SCIENCE,
1962, 60 (169)
:1-&