DEPOSITION OF AMORPHOUS SILICON FILMS FROM GLOW-DISCHARGE PLASMAS OF SILANE

被引:56
作者
BRODSKY, MH [1 ]
机构
[1] IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
关键词
D O I
10.1016/0040-6090(77)90095-5
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
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页码:L23 / L25
页数:3
相关论文
共 9 条
[1]  
BRODSKY MB, TO BE PUBLISHED
[2]  
Chittick R. C., 1970, J NON-CRYST SOLIDS, V3, P255
[3]  
HOLLAHAN JH, 1974, TECHNIQUES APPL CHEM, pCH5
[4]  
KNIGHT JC, 1976, P C STRUCTURE EXCITA, P296
[5]   EFFECTS OF REACTION CONDITIONS ON PLASMA POLYMERIZATION OF ETHYLENE [J].
KOBAYASHI, H ;
SHEN, M ;
BELL, AT .
JOURNAL OF MACROMOLECULAR SCIENCE-CHEMISTRY, 1974, A 8 (02) :373-391
[6]   CONVERSION OF SILANE TO HIGHER SILANES IN A SILENT ELECTRIC DISCHARGE [J].
SPANIER, EJ ;
MACDIARMID, AG .
INORGANIC CHEMISTRY, 1962, 1 (02) :432-&
[7]  
Spear W. E., 1974, 5th International Conference on amorphous and liquid semiconductors, Vol.I, P1
[8]   ELECTRONIC PROPERTIES OF SUBSTITUTED DOPED AMORPHOUS SI AND GE [J].
SPEAR, WE ;
LECOMBER, PG .
PHILOSOPHICAL MAGAZINE, 1976, 33 (06) :935-949
[9]  
THOMSON JJ, 1933, CONDUCTION ELECTRICI, V2, pCH8