ANALYSIS OF ACCELERATED LIFE TEST DATA .2. NUMERICAL METHODS AND TEST PLANNING

被引：11
作者：
NELSON, W
机构：
来源：
IEEE TRANSACTIONS ON ELECTRICAL INSULATION | 1972年 / EI 7卷 / 01期
关键词：
D O I：
10.1109/TEI.1972.299187
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
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页码：36 / &
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